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UNIQUE APPLICATIONS OF OPTICAL PROPERTIES OF SILICON NANOSTRUCTURES
Yury Ryabchikov
SURFACE QUALITY ASSESSMENT USING A MULTISPECTRAL CAMERA FOCUSING ON ACCURACY AND COLOR VARIATIONS OF PRINTED PARTS MADE WITH FDM TECHNOLOGY
OLHA KALMAN, JOZEF HUSAR, PETER LAZOIK, PATRIK FEJKO
DETECTION OF GLASS EDGE CORRUGATION FOR CUTTING DISTANCE OPTIMISATION
ONDREJ MATUSEK, ZDENEK VIT, VLASTIMIL HOTAR

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