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  CHRISTIAN BRECHER, ROBERT SPIERLING, MARCEL FEY

• MEASUREMENT UNCERTAINTY SIMULATION BY MONTE CARLO METHOD IN NANOMETROLOGY

  Jan Sramek, Robert Jankovych

• DETERMINATION OF MEASUREMENT UNCERTAINTY ON CMM SIOS NNM-1

  JAN SRAMEK, ROBERT JANKOVYCH

• FROM THE TRADITIONAL MULTILATERATION TO THE INTEGRATED MULTILATERATION APPROACH: A ROADMAP TOWARDS THE AUTOMATIZATION OF VOLUMETRIC ERROR MAPPING PROCESS FOR LARGE MACHINE TOOLS

  F. Egaña, U. Mutilba, G. Kortaberria, J. Eguskiza, B.A. Check

• DETERMINATION OF MEASUREMENT ACCURACY OF OPTICAL 3D SCANNERS

  RADOMIR MENDRICKY

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