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• ACCURACY OF MEASUREMENT IN NANOMETROLOGY

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• RELATIONSHIP BETWEEN VALUES OF PROFILE AND AREAL SURFACE TEXTURE PARAMETERS

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• NOISE AND STEP HEIGHT PERFORMANCE OF SELECTED OPTICAL SURFACE MEASURING INSTRUMENTS

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• DETERMINATION OF MEASUREMENT UNCERTAINTY ON CMM SIOS NNM-1

  JAN SRAMEK, ROBERT JANKOVYCH

• MEASUREMENT UNCERTAINTY SIMULATION BY MONTE CARLO METHOD IN NANOMETROLOGY

  Jan Sramek, Robert Jankovych

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